2)The Filmetrics®?Profilm3D®?and Profilm3D-200 optical profilometers are affordable, non-contact, white light interferometry-based (WLI) 3D surface topography measurement systems. The Profilm3D series measures nanometer- to millimeter-scale surface features, producing high-resolution 3D surface data and TotalFocus??images (color 3D images with a depth-of-field equal to the vertical scan distance). With a simple, flexible recipe set up, accommodating single scans or automated measurements on multiple sites, the Profilm3D supports both R&D and production environments.
Applications :
- Amorphous & Polysilicon
- Dielectrics
- Hardcoat Thickness
- IC Failure Analysis
- ITO & Other TCOs
- Medical Devices
- Metal Thickness
- Microfluidics
- OLEDs
- Ophthalmic Coatings
- Parylene Coatings
- Photoresist
- Porous Silicon
- Process Films
- Refractive Index & k
- Silicon Wafers & Membranes
- Solar Applications
- Semiconductor Teaching Labs
- Surface Roughness & Finish
- Web Coatings
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